Mill-Jer Wang

To verify manufacturing yield by testing

Jwu-E Chen, Yung-Yuan Chen, Mill-Jer Wang, 1994, Proceedings of IEEE 3rd Asian Test Symposium (ATS).

Guardband determination for the detection of off-state and junction leakages in DRAM testing

R.-L. Jiang, Jwu E. Chen, Chih-Hu Wang, 2001, Proceedings 10th Asian Test Symposium.