R. K. Smith

A novel implementation of noise analysis in general-purpose PDE-based semiconductor device simulators

Fabrizio Bonani, Giovanni Ghione, M. R. Pinto, 1995, Proceedings of International Electron Devices Meeting.

An efficient approach to noise analysis through multidimensional physics-based models

Fabrizio Bonani, Giovanni Ghione, Mark R. Pinto, 1998 .