R. D. Schrimpf
发表
A. L. Sternberg,
A. F. Witulski,
M. B. Smith,
2017,
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
R. D. Schrimpf,
L. Artola,
G. Hubert,
2013,
2013 IEEE International Reliability Physics Symposium (IRPS).
R. D. Schrimpf,
M. Massengill,
2005
.
B. L. Bhuva,
B. Narasimham,
N. N. Mahatme,
2014,
IEEE Transactions on Nuclear Science.
L. W. Massengill,
B. L. Bhuva,
S. Jagannathan,
2013,
IEEE Transactions on Nuclear Science.
Gabor Karsai,
Michael J. Sampson,
Robert A. Reed,
2017
.
R. D. Schrimpf,
M. Li,
Y. F. Li,
2012,
2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology.
R. D. Schrimpf,
R. A. Weller,
R. A. Reed,
2012,
2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology.
Bharat L. Bhuva,
R. D. Schrimpf,
Michael L. Alles,
2007
.
J. S. Kauppila,
L. W. Massengill,
B. L. Bhuva,
2016,
2016 IEEE International Reliability Physics Symposium (IRPS).
W. T. Holman,
R. D. Schrimpf,
Philippe Calvel,
1997,
RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294).
Zuochang Ye,
Yan Wang,
Miao Li,
2012,
IEEE Transactions on Nuclear Science.
R. D. Schrimpf,
Y. Wang,
M. Li,
2011,
IEEE Transactions on Nuclear Science.
R. D. Schrimpf,
K. F. Galloway,
Peter J. Wahle,
1989
.
L. W. Massengill,
Kenneth A. LaBel,
James H. Adams,
2006
.
J. S. Kauppila,
R. D. Schrimpf,
R. A. Reed,
2012,
IEEE Transactions on Nuclear Science.
R. D. Schrimpf,
M. E. Law,
D. M. Fleetwood,
2012,
IEEE Transactions on Nuclear Science.
L. W. Massengill,
P. C. Adell,
W. T. Holman,
.
R. D. Schrimpf,
D. M. Fleetwood,
S. T. Pantelides,
2012,
2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology.
B. L. Bhuva,
R. D. Schrimpf,
I. Chatterjee,
2013,
IEEE Transactions on Nuclear Science.
B. L. Bhuva,
R. D. Schrimpf,
N. J. Gaspard,
2012,
IEEE Transactions on Nuclear Science.
E. Simoen,
C. Claeys,
R. D. Schrimpf,
2011,
IEEE Transactions on Nuclear Science.
L. D. Edmonds,
R. D. Schrimpf,
J. R. Ahlbin,
2012,
IEEE Transactions on Nuclear Science.
D. R. Ball,
M. L. Alles,
R. D. Schrimpf,
2010,
2010 IEEE International SOI Conference (SOI).
Charge Pumping Measurements of Radiation-Induced Interface-Trap Density in Floating-Body SOI FinFETs
R. D. Schrimpf,
S. A. Francis,
D. M. Fleetwood,
2012,
IEEE Transactions on Nuclear Science.
M. L. Alles,
E. Simoen,
C. Claeys,
2013,
IEEE Transactions on Nuclear Science.
En Xia Zhang,
Xiao Shen,
R. D. Schrimpf,
2011,
IEEE Transactions on Nuclear Science.
J. R. Brews,
R. D. Schrimpf,
K. F. Galloway,
1996
.
J. S. Kauppila,
T. D. Haeffner,
A. L. Sternberg,
2014,
IEEE Transactions on Nuclear Science.
D. R. Ball,
T. D. Loveless,
M. L. Alles,
2012,
2012 IEEE International SOI Conference (SOI).
A. L. Sternberg,
A. F. Witulski,
R. D. Schrimpf,
2018,
IEEE Transactions on Nuclear Science.
Lloyd W. Massengill,
R. D. Schrimpf,
John O. Attia,
1999,
1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471).
J. S. Kauppila,
D. R. Ball,
L. W. Massengill,
2016,
2016 IEEE International Reliability Physics Symposium (IRPS).
J. S. Kauppila,
T. D. Haeffner,
L. W. Massengill,
2013,
IEEE Transactions on Nuclear Science.
R. D. Schrimpf,
R. A. Reed,
M. P. King,
2012,
IEEE Transactions on Nuclear Science.
R. D. Schrimpf,
Daniel M. Fleetwood,
K. F. Galloway,
2000
.
R. D. Schrimpf,
M. E. Law,
D. M. Fleetwood,
2011,
IEEE Transactions on Nuclear Science.
L. W. Massengill,
B. L. Bhuva,
R. D. Schrimpf,
2010,
2010 IEEE International Reliability Physics Symposium.
En Xia Zhang,
Xiao Shen,
R. D. Schrimpf,
2013,
IEEE Electron Device Letters.
En Xia Zhang,
M. L. Alles,
R. D. Schrimpf,
2012,
IEEE Transactions on Nuclear Science.
E. Simoen,
C. Claeys,
S. Cristoloveanu,
2011,
2011 International Reliability Physics Symposium.
Dimitri Linten,
Nicholas C. Hooten,
En Xia Zhang,
2014
.
D. R. Ball,
A. L. Sternberg,
M. L. Alles,
2019,
IEEE Transactions on Nuclear Science.
F. Wrobel,
R. D. Schrimpf,
F. Saigne,
2011,
IEEE Transactions on Nuclear Science.
A. L. Sternberg,
Lloyd W. Massengill,
R. D. Schrimpf,
2001
.
Bin Wang,
En Xia Zhang,
M. L. Alles,
2011,
IEEE Transactions on Nuclear Science.
J. S. Kauppila,
D. R. Ball,
L. W. Massengill,
2011,
IEEE 2011 International SOI Conference.
R. D. Schrimpf,
D. M. Fleetwood,
peixiong zhao,
2011,
IEEE Transactions on Nuclear Science.
D. R. Ball,
M. L. Alles,
E. Simoen,
2012,
IEEE Transactions on Nuclear Science.
A. F. Witulski,
R. D. Schrimpf,
R. A. Reed,
2013,
IEEE Transactions on Nuclear Science.
Yoon-Ha Jeong,
En Xia Zhang,
R. D. Schrimpf,
2011,
IEEE Transactions on Nuclear Science.
R. D. Schrimpf,
D. M. Fleetwood,
peixiong zhao,
2011,
IEEE Transactions on Nuclear Science.
R. D. Schrimpf,
N. J. Gaspard,
D. McMorrow,
2013,
IEEE Transactions on Nuclear Science.
J. S. Kauppila,
L. W. Massengill,
B. L. Bhuva,
2015,
IEEE Transactions on Nuclear Science.
R. D. Schrimpf,
M. E. Law,
D. M. Fleetwood,
2012,
IEEE Transactions on Nuclear Science.
B. L. Bhuva,
B. Narasimham,
N. N. Mahatme,
2011,
IEEE Transactions on Nuclear Science.
En Xia Zhang,
Xiao Shen,
R. D. Schrimpf,
2013,
IEEE Transactions on Electron Devices.
Jinshun Bi,
Zhengsheng Han,
R. D. Schrimpf,
2013,
2013 IEEE International Reliability Physics Symposium (IRPS).
Annealing Behavior of a Proton Irradiated Al Ga N/GaN High Electron Mobility Transistor Grown by MBE
R. D. Schrimpf,
K. F. Galloway,
Mary Chen,
2000
.
En Xia Zhang,
J. D. Cressler,
R. D. Schrimpf,
2011,
IEEE Transactions on Nuclear Science.
B. L. Bhuva,
N. N. Mahatme,
E. Simoen,
2012,
IEEE Transactions on Nuclear Science.
Gabor Karsai,
Kenneth A. LaBel,
R. D. Schrimpf,
2018
.
R. L. Pease,
R. D. Schrimpf,
D. M. Fleetwood,
.
D. R. Ball,
B. L. Bhuva,
N. N. Mahatme,
2014,
IEEE Transactions on Nuclear Science.
B. L. Bhuva,
B. Narasimham,
R. D. Schrimpf,
2012,
2012 IEEE International Reliability Physics Symposium (IRPS).
F. Wrobel,
R. D. Schrimpf,
peixiong zhao,
2013,
IEEE Transactions on Nuclear Science.
En Xia Zhang,
Xiao Shen,
R. D. Schrimpf,
2012,
IEEE Transactions on Device and Materials Reliability.
K. A. LaBel,
R. D. Schrimpf,
C. F. Wheatley,
1996
.
R. D. Schrimpf,
D. Linten,
E. Bury,
2018,
IEEE Transactions on Nuclear Science.