K. Maitra

Impact of gate-to-source/drain overlap length on 80-nm CMOS circuit performance

K. Maitra, N. Bhat, K. Maitra, 2004, IEEE Transactions on Electron Devices.

erratum: Small-bandgap endohedral metallofullerenes in high yield and purity

K. Maitra, G. Rice, A. J. Fisher, 1999, Nature.