K. Borutta

Integrated test concepts for in-situ millimeter-wave device characterization

Dietmar Kissinger, Robert Weigel, Benjamin Laemmle, 2015, 2015 IEEE 13th International New Circuits and Systems Conference (NEWCAS).

A silicon integrated microwave vector network analyzer for biomedical sensor read-out applications

R. Weigel, D. Kissinger, I. Nasr, 2014, 2014 IEEE MTT-S International Microwave Symposium (IMS2014).