Anil Bora Yayak

A Study of Cross-Linguistic Speech Emotion Recognition Based on 2D Feature Spaces

Bozena Kostek, Gražina Korvel, Povilas Treigys, 2020, Electronics.

Combining Full Wafer Inspection with Deep Learning to Recognize Wafers with Critical Defects

Anil Bora Yayak, D. B. Cunff, Tamás Sipőcz, 2023, 2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).