Richard D. Deslattes

Crystal Diffraction Spectrometry for Accurate, Non-Invasive kV/Spectral Measurement for Improvement of Mammographic Image Quality.

Richard D. Deslattes, Lawrence T. Hudson, 1995 .

The molar volume of silicon: discrepancies and limitations

Richard D. Deslattes, Ernest G. Kessler, 1999, IEEE Trans. Instrum. Meas..

Production and characterization of ion-beam-sputtered multilayers

Richard D. Deslattes, Joseph Pedulla, 1994, Optics & Photonics.

Upgraded facility for multilayer mirror characterization at NIST

Theodore V. Vorburger, Richard D. Deslattes, Christopher J. Evans, 1992, Optics & Photonics.

Silicon lattice comparisons related to the Avogadro project: uniformity of new material and surface preparation effects

Richard D. Deslattes, Scott M. Owens, Ernest G. Kessler, 1999, IEEE Trans. Instrum. Meas..

X-ray spectra in the 12- to 60-keV energy range from plasmas produced by the OMEGA laser

John F. Seely, Glenn E. Holland, Richard D. Deslattes, 2001, SPIE Optics + Photonics.

Design, structure, and performance of narrow band multilayer mirrors for solar imaging

Richard D. Deslattes, Charles S. Tarrio, Joseph Pedulla, 1994, Optics & Photonics.

Off-line quality control for Bragg-Laue optics

Richard D. Deslattes, R. Deslattes, 1997, Optics & Photonics.