F. L. Williams

Investigation of thin films using total internal reflection microscopy

F. L. Williams, 1990, Laser Damage.

In situ characterization of thin‐film defect generation using total internal reflection microscopy

B. J. Pond, F. L. Williams, G. A. Petersen, 1992 .

Ion Beam Processing of Optical Materials

F. L. Williams, J. McNeil, G. Al-Jumaily, 1988 .