S.V. Walstra

Circuit-level modeling of soft errors in integrated circuits

Changhong Dai, S.V. Walstra, S. Walstra, 2005, IEEE Transactions on Device and Materials Reliability.

The effect of intrinsic capacitance degradation on circuit performance

Changhong Dai, Shiuh-Wuu Lee, S.V. Walstra, 1996, 1996 Symposium on VLSI Technology. Digest of Technical Papers.