Jay F. Marchiando

Semiconductor Measurement Technology: A Software Program for Aiding the Analysis of Ellipsometric Measurements, Simple Models

Jay F. Marchiando, J. Marchiando, 1989 .

APPLICATION OF THE COLLOCATION METHOD IN THREE DIMENSIONS TO A MODEL SEMICONDUCTOR PROBLEM

Jay F. Marchiando, J. Marchiando, 1996 .

Quantitative Sub-Micrometer Linewidth Determination Using Electron Microscopy

Dennis A. Swyt, Stephen W. Jensen, Jay F. Marchiando, 1981, Advanced Lithography.

Regression procedure for determining the dopant profile in semiconductors from scanning capacitance microscopy data

Joseph J. Kopanski, Jay F. Marchiando, J. Marchiando, 2002 .

Scanning capacitance microscopy measurement of two-dimensional dopant profiles across junctions

Joseph J. Kopanski, H. E. Smith, D. W. Berning, 1998 .

Scanning capacitance microscopy measurements and modeling: Progress towards dopant profiling of silicon

Jeremiah R. Lowney, Joseph J. Kopanski, Jay F. Marchiando, 1995 .