Thomas Schuelke

Short-time investigation of deposition processes

T. Witke, Peter Siemroth, Thomas Schuelke, 1995, International Congress on High-Speed Imaging and Photonics.

Nondestructive testing of damage layers in semiconductor materials by surface acoustic waves

Andreas Franke, Thomas Schuelke, D. Schneider, 2002, SPIE Advanced Lithography.

Analysis on the metal etch resist selectivity measurement

Thomas Schuelke, Vayalakkara Premachandran, Paul Kwok Keung Ho, 1997, Advanced Lithography.

Multiple substrate microwave plasma-assisted chemical vapor deposition single crystal diamond synthesis

Timothy A. Grotjohn, Donnie K. Reinhard, Michael F. Becker, 2008 .

Highly sensitive detection of urinary cadmium to assess personal exposure.

Thomas Schuelke, A. Argun, L. Tempelman, 2013, Analytica chimica acta.

Comparison of filtered high-current pulsed arc deposition (φ-HCA) with conventional vacuum arc methods

Peter Siemroth, Thomas Schuelke, Bernd Schultrich, 2000 .

SiO2 antireflection layers for single-crystal diamond

Timothy A. Grotjohn, Donnie K. Reinhard, Michael F. Becker, 2012 .