X. Wen

Power-Aware Test Pattern Generation for At-Speed LOS Testing

Arnaud Virazel, Alberto Bosio, Luigi Dilillo, 2011, 2011 Asian Test Symposium.

An enterprise modelling method based on an extension mechanism

H. Wang, Y. Zhou, X. Wen, 2009, Int. J. Comput. Integr. Manuf..

An extended GRAI model for enterprise process diagnosis

X. Wen, G. Wang, X. Xu, 2007, Int. J. Comput. Integr. Manuf..

Hybrid Compact-WENO Finite Difference Scheme with Radial Basis Function Based Shock Detection Method for Hyperbolic Conservation Laws

X. Wen, Z. Gao, Wai-Sun Don, 2018, SIAM J. Sci. Comput..