Byung Sup Shim

Robust pad layout to improve wire bonding reliability

Yong Tae Kim, Kyoung-Hwan Kim, Hong Kook Min, 2011, 2011 International Reliability Physics Symposium.

A New Statistical Model for SILC Distribution of Flash Memory and the Effect of Spatial Trap Distribution

Hong Shick Min, Young June Park, Seonghoon Jin, 2006, 2006 International Conference on Simulation of Semiconductor Processes and Devices.