Andre Bai

发表

Anneliese Amschler Andrews, Tom Chen, Charles Anderson, 1998, Proceedings Third IEEE International High-Assurance Systems Engineering Symposium (Cat. No.98EX231).

Fast Anti-Random (FAR) Test Generation to Improve the Quality of Behavioral Model Verification

Anneliese Amschler Andrews, Tom Chen, Charles Anderson, 2002, J. Electron. Test..