E. Ibok

Modelling Calibration and Validation of Contributions to Stress in the STI Process Sequence

Robert W. Dutton, K. Garikipati, I. De Wolf, 1999 .

Substrate-current-induced hot electron (SCIHE) injection: a new convergence scheme for flash memory

B. Bandyopadhyay, David L. Kencke, E. Ibok, 1995, Proceedings of International Electron Devices Meeting.

Modelling and Validation of Contribions to Stress in the Shallow Trench Isolation Process Sequence

Robert W. Dutton, I. De Wolf, K. Garikipati, 2000 .

A convergence scheme for over-erased flash EEPROM's using substrate-bias-enhanced hot electron injection

B. Bandyopadhyay, C.-Y. Hu, E. Ibok, 1995, IEEE Electron Device Letters.