A. Grub

A procedure for accurate noise measurements of one port devices with high reflection coefficients

J. M. Miranda, V. Krozer, J. L. Sebastian, 1994, 1994 IEEE MTT-S International Microwave Symposium Digest (Cat. No.94CH3389-4).

Deep Level Characterization of Submillimeter-Wave GaAs Schottky Diodes Produced by a Novel In-Situ Electrochemical Process

Hans L. Hartnagel, Hideki Hasegawa, Tamotsu Hashizume, 1993 .