Alfred V. Gomes

Low Cost Dynamic Test Methodology for High Precision ΣΔ ADCs

Abhijit Chatterjee, Vishwanath Natarajan, Le Jin, 2009, 2009 Asian Test Symposium.

Alternate Test Generation for Detection of Parametric Faults

Alfred V. Gomes, A. Gomes, 2003 .

Robust optimization based backtrace method for analog circuits

Abhijit Chatterjee, Alfred V. Gomes, 1999, 1999 IEEE/ACM International Conference on Computer-Aided Design. Digest of Technical Papers (Cat. No.99CH37051).

Minimal length diagnostic tests for analog circuits using test history

Abhijit Chatterjee, Alfred V. Gomes, 1999, Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078).

Signal Acquisition of High-Speed Periodic Signals Using Incoherent Sub-Sampling and Back-End Signal Reconstruction Algorithms

Abhijit Chatterjee, Hyun Woo Choi, Alfred V. Gomes, 2011, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

Distance constrained dimensionality reduction for parametric fault test generator

Abhijit Chatterjee, Alfred V. Gomes, 2001, Proceedings 10th Asian Test Symposium.

Modular fault simulation of mixed signal circuits with fault ranking by severity

Abhijit Chatterjee, Alfred V. Gomes, Ramakrishna Voorakaranam, 1998, Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223).