W.Y.C. Lai
发表
William M. Mansfield,
Peter Kurczynski,
Bernard Sadoulet,
2005,
SPIE MOEMS-MEMS.
A. Ghetti,
H. Vaidya,
W.Y.C. Lai,
1999,
1999 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.99CH36325).
H. Vaidya,
W.Y.C. Lai,
M.R. Pinto,
1997,
International Electron Devices Meeting. IEDM Technical Digest.
J. T. Clemens,
C.-T. Liu,
H. Vaidya,
1998,
1998 3rd International Symposium on Plasma Process-Induced Damage (Cat. No.98EX100).
J. T. Clemens,
J. F. Miner,
C. T. Liu,
1999,
1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296).
J. T. Clemens,
J. F. Miner,
C.-T. Liu,
1999,
1999 4th International Symposium on Plasma Process-Induced Damage (IEEE Cat. No.99TH8395).
W.Y.C. Lai,
Y. Ma,
K.P. Cheung,
1998,
IEEE Electron Device Letters.
W.Y.C. Lai,
C. Liu,
W. Lai,
1997,
International Electron Devices Meeting. IEDM Technical Digest.