H.-J. Engelmann

Status of the FRG activities on direct disposal of spent LWR-fuel

K. D. Closs, H.-J. Engelmann, 1990 .

Calculation of neutron dose rates including backscattering of a POLLUX cask in drifts of a repository mine

H.-J. Engelmann, M. Khamis, J. P. Lempert, 1994 .

Moderne Barrieresysteme für die Kupfermetallisierung höchstintegrierter Halbleiterbauelemente

H.-J. Engelmann, C. Wenzel, 2001 .

Disposal technologies and concepts 2000 : DisTec 2000

H.-J. Engelmann, P. Brennecke, 2000 .

First results from the Active Handling Experiments with Neutron Sources

H.-J. Engelmann, M. Khamis, J. P. Lempert, 1995 .

Thin Film and Interface Analysis of Microprocessor Device Structures – Requirements and Practical Examples

Werner Blum, H.-J. Engelmann, Ehrenfried Zschech, 2005 .

Inverse giant magnetoresistance in granular Nd/sub 2/Fe/sub 14/B//spl alpha/-Fe

H.-J. Engelmann, K.-H. Müller, M. Wolf, 1997 .

Integration and optimization of embedded-sige, compressive and tensile stressed liner films, and stress memorization in advanced SOI CMOS technologies

D. Greenlaw, H.-J. Engelmann, N. Kepler, 2005, IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest..

High performance 65 nm SOI technology with enhanced transistor strain and advanced-low-K BEOL

J. Gill, D. Mocuta, D. Greenlaw, 2005, IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest..

Direct evidence of Cu/cap/liner edge being the dominant electromigration path in dual damascene Cu interconnects

H.-J. Engelmann, Ehrenfried Zschech, Subodh G. Mhaisalkar, 2007 .