Martina Baeumler

Failure Analysis of 100 nm AlGaN/GaN HEMTs Stressed under On- and Off-State Stress

Oliver Ambacher, Rüdiger Quay, Vladimir Polyakov, 2020, 2020 IEEE International Reliability Physics Symposium (IRPS).

Reliability and Failure Analysis of 100 nm AlGaN/GaN HEMTs under DC and RF Stress

Maximilian Dammann, Michél Simon-Najasek, Helmer Konstanzer, 2021, 2021 IEEE International Reliability Physics Symposium (IRPS).

Investigation of Leakage Current of AlGaN/GaN HEMTs Under Pinch-Off Condition by Electroluminescence Microscopy

Wolfgang Bronner, Michael Mikulla, Oliver Ambacher, 2010 .