Laurent Escotte

Long-term stability of an SiGe HBT-based active cold load

Jean-Marc Goutoule, Emilie Leynia de la Jarrige, Laurent Escotte, 2011, 2011 IEEE International Geoscience and Remote Sensing Symposium.

Identification of the physical signatures of CDM induced latent defects into a DC-DC converter using low frequency noise measurements

Yuan Gao, Nicolas Guitard, Laurent Escotte, 2007, Microelectron. Reliab..

High-frequency noise contribution to phase noise in microwave oscillators and amplifiers

Gilles Cibiel, Laurent Escotte, Olivier Llopis, 2004, SPIE International Symposium on Fluctuations and Noise.

Long-term reliability of silicon bipolar transistors subjected to low constraints

Philippe Perdu, Laurent Escotte, Marise Bafleur, 2007, Microelectron. Reliab..

A cost-effective technique for extending the low-frequency range of a microwave noise parameter test set

Laurent Escotte, Jacques Graffeuil, Jean-Guy Tartarin, 1999, IEEE Trans. Instrum. Meas..

Ka-band Coplanar Low-Noise Amplifier Design with Power PHEMTs

Laurent Escotte, Jacques Graffeuil, Daniel Roques, 2003, 2003 33rd European Microwave Conference, 2003.

Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications

Philippe Perdu, David Trémouilles, Nicolas Guitard, 2004, Microelectron. Reliab..

On-wafer noise characterization of low-noise amplifiers in the Ka-band

Laurent Escotte, Jacques Graffeuil, J. L. Cazaux, 2003, IEEE Trans. Instrum. Meas..

GaN HEMT noise model performance under nonlinear operation

Matthias Rudolph, Ralf Doerner, Laurent Escotte, 2014, 2014 44th European Microwave Conference.

Stability Analysis of an SiGe HBT-Based Active Cold Load

Laurent Escotte, Eric Gonneau, Emilie Leynia de la Jarrige, 2011, IEEE Transactions on Microwave Theory and Techniques.