Han-Soo Joo

Temperature effects on silicon-oxide-nitride-oxide-silicon transistors under channel hot electron injection operation (Electron devices: 第15回先端半導体デバイスの基礎と応用に関するアジア・太平洋ワークショップ(AWAD2007))

Ga-Won Lee, Hi-Deok Lee, Won-Ho Choi, 2007 .

Inherent Issues and Challenges of Program Disturbance of 3D NAND Flash Cell

Ki-Hong Lee, Yoon-Soo Jang, Eun-Seok Choi, 2012, 2012 4th IEEE International Memory Workshop.

A Novel 3D Cell Array Architecture for Terra-Bit NAND Flash Memory

Eun-Seok Choi, Sung-Kye Park, Gyu-Seog Cho, 2011, 2011 3rd IEEE International Memory Workshop (IMW).

Characterization of Near-Interface Oxide Trap Density in Nitrided Oxides for Nanoscale MOSFET Applications

Chang-Ki Baek, Hee-Hwan Ji, In-Shik Han, 2009, IEEE Transactions on Nanotechnology.

Chip Level Reliability of MANOS Cells under Operating Conditions

Kyoung-Hwan Park, Jeong-Hyong Yi, Hyun-Seung Yoo, 2009, 2009 IEEE International Memory Workshop.

Novel test structures for on-chip characterization of coupling capacitance variation by in- and anti-phase crosstalk in multi-level metallization

Hee-Hwan Ji, Dae-Byung Kim, Dae-Mann Kim, 2006, 2006 IEEE International Conference on Microelectronic Test Structures.