N. Dayanand

Static fault localization on Memory failures using Photon Emission Microscopy

C. Q. Chen, J. Lam, G. B. Ang, 2015, 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits.

Failure analysis methodology for the localization of thin and ultra-thin metal barrier residue

G. B. Ang, Z. H. Mai, A. C. T. Quah, 2014, Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).