L.W. Cheng

A Low-cost Automated Measurement System for Quality Control of AMLCD Manufacturing

L.W. Cheng, S.J. Ruan, S. Ruan, 2006, 2006 1ST IEEE Conference on Industrial Electronics and Applications.

SiGe Channel CMOSFETs Fabricated on (110) Surfaces with TaC/HfO2 Gate Stacks

L.W. Cheng, P.W. Liu, W.T. Chiang, 2007, 2007 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA).

45nm gate length Bulk/PD-SOI CMOS transistors with low gate leakage current for high speed and low power applications

D. Wristers, L.W. Cheng, S.C. Chien, 2003, ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003..

The observation of trapping and detrapping effects in high-k gate dielectric MOSFETs by a new gate current Random Telegraph Noise (IG-RTN) approach

L.W. Cheng, S.C. Chien, Y.S. Hsieh, 2008, 2008 IEEE International Electron Devices Meeting.