Yi-Nan Shen

Detection of multiple faults in CMOS circuits using a behavioral approach

Fabrizio Lombardi, Yi-Nan Shen, 1992, Digest of Papers. 1992 IEEE VLSI Test Symposium.

Fault detection in a testable PLA with low overhead for production testing

Fabrizio Lombardi, Yi-Nan Shen, 1989, 1989 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers.