D. Hisamoto

A new soft-error phenomenon in VLSIs: the alpha-particle-induced source/drain penetration (ALPEN) effect

Eiji Takeda, T. Toyabe, D. Hisamoto, 1988 .

Extension of Universal Mobility Curve to Multi-Gate MOSFETs

R. Tsuchiya, N. Sugii, D. Hisamoto, 2007, 2007 IEEE International Electron Devices Meeting.

FD-SOI MOSFETs for the low-voltage nanoscale CMOS era

R. Tsuchiya, K. Itoh, N. Sugii, 2009, 2009 IEEE International SOI Conference.