S.C. Huang

Circuit and silicide impact on the correlation between TLP and ESD (HBM and MM)

Mi-Chang Chang, J.H. Lee, M.H. Song, 2004, IEEE International Integrated Reliability Workshop Final Report, 2004.

Growth and characterization of 380-nm InGaN/AlGaN LEDs grown on patterned sapphire substrates

S.C. Huang, W. Wang, R. Horng, 2007 .