Se-Jung Oh

Grounding Resistance Measurement and Analysis of Building Structures for Applying as Safety Earthing

Chan-O Kim, Se-Jung Oh, 2012 .

Thermal annealing effects on the structural and electrical properties of HfO2/Al2O3 gate dielectric stacks grown by atomic layer deposition on Si substrates

Jong-Ho Lee, Hee-Sung Kang, Cheol Seong Hwang, 2003 .

Comparison of HfO2 films grown by atomic layer deposition using HfCl4 and H2O or O3 as the oxidant

Ho-Kyu Kang, Jong-Ho Lee, Cheol Seong Hwang, 2003 .