Glen Gilfeather

Semiconductor product analysis challenges based on the 1999 ITRS

Richard E. Anderson, Daniel Yim, Thomas W. Joseph, 2000 .

Controlled silicon thinning for design debug of C4 packaged ICs

Nicholas Antoniou, Victoria J. Bruce, Rosalinda M. Ring, 1999, 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296).

Single contact optical beam induced currents (SCOBIC)-a new failure analysis technique

J.C.H. Phang, Glen Gilfeather, C. E. Soh, 2000, 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059).