A. Lill

Ring Oscillator Structure For realistic Dynamic Stress Of MOSFETS And Interconnects

F. Neppl, Josef Winnerl, A. Lill, 1988, Proceedings of the IEEE International Conference on Microelectronic Test Structures.

Hot carrier hardness analysis of submicrometer LDD devices

Marius K. Orlowski, C. Mazure, A. Lill, 1991 .

Lifetime prediction for PMOS and NMOS devices based on a degradation model for gate-bias-stress

A. Narr, A. Lill, 1997 .

Width-independent narrow nMOSFET reliability by split-well drive-in

C. Mazure, A. Lill, C. Zeller, 1990, IEEE Electron Device Letters.

Influence of transistor degradation on CMOS performance and impact on life time criterion

D. Schmitt-Landsiedel, J. Winnerl, F. Neppl, 1988, Technical Digest., International Electron Devices Meeting.