Mehran Amrbar

Heavy Ion Single Event Effects Measurements of Xilinx Zynq-7000 FPGA

Mehran Amrbar, Farokh Irom, Steven M. Guertin, 2015, 2015 IEEE Radiation Effects Data Workshop (REDW).

Reliability characterization of a commercial TaOx-based ReRAM

Mehran Amrbar, Douglas Sheldon, Mark White, 2014, 2014 IEEE International Integrated Reliability Workshop Final Report (IIRW).

Results for P2020 and P5 eescale Processors

Mehran Amrbar, M Steven, M. Guertin, 2014 .

Radiation Test Results for Common CubeSat Microcontrollers and Microprocessors

Mehran Amrbar, Steven M. Guertin, Sergeh Vartanian, 2015, 2015 IEEE Radiation Effects Data Workshop (REDW).

Implementation of complete ASIC design using low power methodology

Mehran Amrbar, 2013 .

SEE Test Results for P2020 and P5020 Freescale Processors

Mehran Amrbar, Steven M. Guertin, 2014, 2014 IEEE Radiation Effects Data Workshop (REDW).

Single Event Testing of SDRAM, DDR2 and DDR3 Memories

Mehran Amrbar, Steven M. Guertin, 2016, 2016 IEEE Radiation Effects Data Workshop (REDW).

Compendium of Single-Event Latchup and Total Ionizing Dose Test Results of Commercial and Radiation Tolerant Operational Amplifiers

Mehran Amrbar, Farokh Irom, Shri G. Agarwal, 2014, 2014 IEEE Radiation Effects Data Workshop (REDW).

Heavy Ion Single Event Effects Measurements of 512Mb ISSI SDRAM

Mehran Amrbar, Farokh Irom, F. Irom, 2015, 2015 IEEE Radiation Effects Data Workshop (REDW).