Lotte Haxen Østergaard

Degradation mapping in high power IGBT modules using four-point probing

Pramod Ghimire, Vladimir N. Popok, Kristian Bonderup Pedersen, 2015, Microelectron. Reliab..

Degradation evolution in high power IGBT modules subjected to sinusoidal current load

Pramod Ghimire, Kristian Bonderup Pedersen, Vladimir Popok, 2015, Journal of Materials Science: Materials in Electronics.