H.M. Przewlocki

The new generation of the photoelectric measurement methods of mos structure parameters

H.M. Przewlocki, 2006, Proceedings of the International Conference Mixed Design of Integrated Circuits and System, 2006. MIXDES 2006..

A photoelectric method to determine lateral distribution of the effective contact potential difference in MOS structures

L. Borowicz, A. Kudla, H.M. Przewlocki, 2004, Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510).