F. Beaudoin

Positive photon discrimination for ultra low voltage IC analysis

P. Perdu, D. Lewis, M. Leibowitz, 2004, 2004 IEEE International Reliability Physics Symposium. Proceedings.

A 5-Gbit/s CMOS optical receiver frontend

F. Beaudoin, M. El-Gamal, F. Beaudoin, 2002, The 2002 45th Midwest Symposium on Circuits and Systems, 2002. MWSCAS-2002..

Dynamic Thermal Laser Stimulation Theory and Applications

P. Perdu, D. Lewis, K. Sanchez, 2006, 2006 IEEE International Reliability Physics Symposium Proceedings.

TRE signal processing by positive photon discrimination

P. Perdu, G. Faggion, R. Desplats, 2004, Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743).

Delay variation mapping induced by dynamic laser stimulation

P. Perdu, D. Lewis, G. Woods, 2005, 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..

Dynamic Optical Techniques for IC Debug and Failure Analysis

P. Perdu, D. Lewis, K. Sanchez, 2006, 2006 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits.

ESD induced latent defects in CMOS ICs and reliability impact

P. Perdu, M. Bafleur, D. Tremouilles, 2004, 2004 Electrical Overstress/Electrostatic Discharge Symposium.

Josephson-junction-embedded transmission-line resonators: From Kerr medium to in-line transmon

Jay M. Gambetta, F. Beaudoin, J. Gambetta, 2012, 1204.2237.

Thermal laser stimulation effects on NMOS transistor

P. Perdu, D. Lewis, A. Firiti, 2004, Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743).