K. Fritz

发表

An SEU hardening approach for high-speed SiGe HBT digital logic

John D. Cressler, Barry K. Gilbert, Paul W. Marshall, 2003 .

A comparative study of heavy-ion and proton-induced bit-error sensitivity and complex burst-error modes in commercially available high-speed SiGe BiCMOS

R. Reed, D. McMorrow, C. Seidleck, 2004, IEEE Transactions on Nuclear Science.