S. Yamaguchi

IS PHYSICALLY SOUND AND PREDICTIVE MODELING OF NMOS SUBSTRATE CURRENTS POSSIBLE

Christoph Jungemann, Bernd Meinerzhagen, H. Goto, 1998 .

Is there experimental evidence for a difference between surface and bulk impact ionization in silicon?

H. Goto, C. Jungemann, S. Yamaguchi, 1996, International Electron Devices Meeting. Technical Digest.