C. Leroux

Industrial transfer and stabilization of a CMOS-JFET-bipolar radiation-hard analog-digital SOI technology

J. L. Pelloie, E. Delagnes, O. Flament, 1998 .

Parasitic Capacitance Analysis in Short Channel GaN MIS-HEMTs

Cyrille Le Royer, Romain Gwoziecki, Gérard Ghibaudo, 2021, ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC).

Experimental determination of mobility scattering mechanisms in Si/HfO/sub 2//TiN and SiGe:C/HfO/sub 2//TiN surface channel n- and p-MOSFETs

G. Ghibaudo, F. Andrieu, T. Ernst, 2004, IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..

Parasitic transients induced by floating substrate effect and bipolar transistor on SOI technologies

B. Giffard, J. Gautier, A.J. Auberton-Herve, 1991, ESSDERC '91: 21st European Solid State Device Research Conference.

DMILL, a mixed analog-digital radiation-hard BICMOS technology for high energy physics electronics

Eric Delagnes, B. Paul, D. Lachartre, 1995 .

Work-function engineering in gate first technology for multi-VT dual-gate FDSOI CMOS on UTBOX

X. Garros, J. Mazurier, O. Rozeau, 2010, 2010 International Electron Devices Meeting.

Analysis of oxide breakdown mechanism occurring during ESD pulses

G. Reimbold, P. Andreucci, C. Leroux, 2000, 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059).

An attempt to explain thermally induced soft failures during low level ESD stresses: study of the differences between soft and hard NMOS failures.

G. Reimbold, D. Lafond, P. Salome, 1997, Proceedings Electrical Overstress/Electrostatic Discharge Symposium.

Characterization and modeling of hysteresis phenomena in high K dielectrics

X. Garros, G. Reimbold, G. Ghibaudo, 2004, IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..

Hybrid FDSOI/bulk High-k/metal gate platform for low power (LP) multimedia technology

X. Garros, O. Faynot, D. Noblet, 2009, 2009 IEEE International Electron Devices Meeting (IEDM).

Industrial transfer and stabilization of a CMOS-JFET-bipolar radiation-hard analog-digital SOI technology

O. Faynot, B. Paul, D. Lachartre, 1998, 1998 IEEE Nuclear Science Symposium Conference Record. 1998 IEEE Nuclear Science Symposium and Medical Imaging Conference (Cat. No.98CH36255).

Investigation of HfO2 Dielectric Stacks Deposited by ALD with a Mercury Probe

X. Garros, G. Reimbold, D. Blin, 2002, 32nd European Solid-State Device Research Conference.

Electron mobility enhancement in uniaxially strained MOSFETs: Extraction of the effective mass variation

G. Reimbold, D. Blachier, M. Casse, 2006, 2006 European Solid-State Device Research Conference.