Anthony P. Ambler

发表

Behavioral Test Economics

Scott Davidson, Anthony P. Ambler, Helen Davidson, 2006, 2006 IEEE International Test Conference.

Design Trade-Offs and Power Reduction Techniques for High Performance Circuits and System

Anthony P. Ambler, Taikyeong T. Jeong, 2006, ICCSA.

System manufacturing test cost model

David Williams, Anthony P. Ambler, 2002, Proceedings. International Test Conference.

An Analysis of the Economics of Self Test

Prab Varma, Keith Baker, Anthony P. Ambler, 1984, ITC.

DOM: a defect occurrence model for evaluating the life cycle costs of test strategies

Erwin Trischler, Anthony P. Ambler, Jochen Dick, 1992 .

Economics in design and test

Anthony P. Ambler, Chryssa Dislis, I. D. Dear, 1993, Proceedings of 1993 IEEE International Conference on Computer Design ICCD'93.

Cost-effective system-level test strategies

Anthony P. Ambler, Des Farren, 1995, Proceedings of 1995 IEEE International Test Conference (ITC).

Using the nonlinear property of FSR and dictionary coding for reduction of test volume

Jae-Hoon Jeong, Anthony P. Ambler, Il-soo Lee, 2005, IEEE Computer Society Annual Symposium on VLSI: New Frontiers in VLSI Design (ISVLSI'05).

Economic effects in design and test

Anthony P. Ambler, Chryssa Dislis, I. D. Dear, 1991, IEEE Design & Test of Computers.

The Economics of System-Level Testing

Anthony P. Ambler, Des Farren, 1997, IEEE Des. Test Comput..

Economics modelling for the determination of test strategies for complex VLSI boards

Anthony P. Ambler, Chryssa Dislis, I. D. Dear, 1993, Proceedings of IEEE International Test Conference - (ITC).

A HW/SW Co-design Methodology: An Accurate Power Efficiency Model and Design Metrics for Embedded System

Gyung-Leen Park, Anthony P. Ambler, Taikyeong T. Jeong, 2009, 2009 10th ACIS International Conference on Software Engineering, Artificial Intelligences, Networking and Parallel/Distributed Computing.

Sensitivity analysis in economics based test strategy planning

Erwin Trischler, Anthony P. Ambler, Chryssa Dislis, 1994, J. Electron. Test..

System test cost modelling based on event rate analysis

Anthony P. Ambler, Des Farren, 1994, Proceedings of 3rd International Workshop on the Economics of Design, Test and Manufacturing.

Reduction of power and test time by removing cluster of don't-care from test data set

Anthony P. Ambler, Yu-Ting Lin, Il-soo Lee, 2005, IEEE Computer Society Annual Symposium on VLSI: New Frontiers in VLSI Design (ISVLSI'05).

Test strategy planning using economic analysis

Anthony P. Ambler, Chryssa Dislis, I. D. Dear, 1994, J. Electron. Test..

ULTIMATE: A Hardware Logic Simulation Engine

Anthony P. Ambler, M. E. Glazier, A. Ambler, 1984, 21st Design Automation Conference Proceedings.

Economics modelling for long lasting systems

Anthony P. Ambler, M. G. Wahl, Mohammed Rahman, 2000 .

Is it rocket science?

Anthony P. Ambler, 2002, Proceedings. International Test Conference.

Algorithms for cost optimised test strategy selection

Anthony P. Ambler, Chryssa Dislis, J. H. Dick, 1993, Proceedings of IEEE International Test Conference - (ITC).

From DFT to systems test-a model based cost optimisation tool

Anthony P. Ambler, Michael G. Wahl, Mohammed Rahman, 2001, Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001.

Cost analysis of test method environments

Anthony P. Ambler, Chryssa Dislis, I. D. Dear, 1989, Proceedings. 'Meeting the Tests of Time'., International Test Conference.

The application and use of boundary scan: Bleeker, H, van den Eijnden, P and de Jong, FBoundary-scan test - a practical approach Kluwer Academic (1992) ISBN 0 7923 9296 5, £50.75, pp 222

Anthony P. Ambler, 1993, Microprocess. Microsystems.

Economically Viable Automatic Insertion of Self-Test Features for Custom VLSI

D. F. Burrows, Anthony P. Ambler, I. D. Dear, 1986, ITC.