N. Kotani

New Filler-Induced Failure Mechanism in Plastic Encapsulated VLSI Dynamic MOS Memories

H. Matsumoto, M. Yamada, J. Fukushima, 1985, 23rd International Reliability Physics Symposium.

An artificial fingerprint device (AFD): a study of identification number applications utilizing characteristics variation of polycrystalline silicon TFTs

Masahide Inuishi, Shigeto Maegawa, Yasuo Inoue, 2003 .