Chun Ming Chen
发表
Laser voltage imaging and probing, efficient techniques for scan chain verification in advanced node
Shih Yuan Liu,
Jian Chang Lin,
Hsin Hung Chou,
2017,
2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
Chun Ming Chen,
Yu Hsiang Shu,
Wen Cheng Hsu,
2017,
2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).