Rene Krenz-Baath
发表
Friedrich Hapke,
Jürgen Schlöffel,
Andreas Glowatz,
2010,
2010 IEEE International Test Conference.
Jaan Raik,
Hans G. Kerkhoff,
Matteo Sonza Reorda,
2017,
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017.
Roman Obermaisser,
Rene Krenz-Baath,
Ayman Murshed,
2016,
2016 11th IEEE Symposium on Industrial Embedded Systems (SIES).
Friedrich Hapke,
Andreas Glowatz,
Rene Krenz-Baath,
2013,
2013 IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS).
Rolf Drechsler,
Jürgen Schlöffel,
Daniel Tille,
2010,
2010 15th IEEE European Test Symposium.
Rolf Drechsler,
Rene Krenz-Baath,
Stephan Eggersglüß,
2016,
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
Erik G. Larsson,
Farrokh Ghani Zadegan,
Artur Jutman,
2016
.
Roman Obermaisser,
Rene Krenz-Baath,
Ayman Murshed,
2015,
10th IEEE International Symposium on Industrial Embedded Systems (SIES).
Erik G. Larsson,
Farrokh Ghani Zadegan,
Rene Krenz-Baath,
2017
.
Rolf Drechsler,
Rene Krenz-Baath,
Stephan Eggersglüß,
2014,
2014 19th IEEE European Test Symposium (ETS).
Rene Krenz-Baath,
Erik Larsson,
Farrokh Ghani Zadegan,
2016,
2016 IEEE International Test Conference (ITC).
Jürgen Schlöffel,
Andreas Glowatz,
Rene Krenz-Baath,
2007,
12th IEEE European Test Symposium (ETS'07).
Rolf Drechsler,
Friedrich Hapke,
Andreas Glowatz,
2012,
2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS).
Farrokh Ghani Zadegan,
Rene Krenz-Baath,
Erik Larsson,
2015,
2015 IEEE International Test Conference (ITC).
Friedrich Hapke,
Martin Keim,
Rene Krenz-Baath,
2013,
2013 Euromicro Conference on Digital System Design.
Friedrich Hapke,
Andreas Glowatz,
Rene Krenz-Baath,
2012,
2012 15th Euromicro Conference on Digital System Design.
Farrokh Ghani Zadegan,
Artur Jutman,
Rene Krenz-Baath,
2014,
2014 IEEE 23rd Asian Test Symposium.
Farrokh Ghani Zadegan,
Artur Jutman,
Riccardo Cantoro,
2016
.
Camelia Hora,
Friedrich Hapke,
Jürgen Schlöffel,
2009,
2009 International Test Conference.
Matteo Sonza Reorda,
Farrokh Ghani Zadegan,
Artur Jutman,
2016,
2016 IEEE International Test Conference (ITC).