Yannick Bonhomme

发表

Transaction-based modeling for large scale simulations of heterogeneous systems

Richard Buchmann, Mickael Cartron, Yannick Bonhomme, 2009, SimuTools.

Method of configurable memory protection against permanent and transient errors and apparent device

Valentin Gherman, Yannick Bonhomme, Samuel Evain, 2010 .

Memory Reliability Improvement Based on Maximized Error-Correcting Codes

Valentin Gherman, Yannick Bonhomme, Samuel Evain, 2013, J. Electron. Test..

A gated clock scheme for low power scan-based BIST

Patrick Girard, Serge Pravossoudovitch, Christian Landrault, 2001, Proceedings Seventh International On-Line Testing Workshop.

Power-Driven Routing-Constrained Scan Chain Design

Patrick Girard, Serge Pravossoudovitch, Christian Landrault, 2004, J. Electron. Test..

Transaction-based modeling for large scale simulations of heterogeneous systems

Richard Buchmann, Yannick Bonhomme, Mickael Cartron, 2009, SIMUTools 2009.

Design of routing-constrained low power scan chains

Arnaud Virazel, Patrick Girard, Serge Pravossoudovitch, 2004, Proceedings Design, Automation and Test in Europe Conference and Exhibition.

System-level hardware-based protection of memories against soft-errors

Valentin Gherman, Mickael Cartron, Yannick Bonhomme, 2009, 2009 Design, Automation & Test in Europe Conference & Exhibition.

Programmable restricted SEC codes to mask permanent faults in semiconductor memories

Valentin Gherman, Yannick Bonhomme, Samuel Evain, 2010, 2010 IEEE 16th International On-Line Testing Symposium.

Embedded wire diagnosis sensor for intermittent fault location

Luca Incarbone, Fabrice Auzanneau, Yannick Bonhomme, 2014, IEEE SENSORS 2014 Proceedings.

Power-On Controller for high lifetime wireless sensor nodes

Mickael Cartron, Yannick Bonhomme, Nathaniel Seymour, 2008, WSAN.

Test power: a big issue in large SOC designs

Patrick Girard, Serge Pravossoudovitch, Christian Landrault, 2002, Proceedings First IEEE International Workshop on Electronic Design, Test and Applications '2002.

Power driven chaining of flip-flops in scan architectures

Patrick Girard, Serge Pravossoudovitch, Christian Landrault, 2002, Proceedings. International Test Conference.

Low Power Scan Chain Design: A Solution for an Efficient Tradeoff Between Test Power and Scan Routing

Patrick Girard, Yannick Bonhomme, P. Girard, 2005, Journal of Low Power Electronics.

Memory reliability improvements based on maximized error-correcting codes

Valentin Gherman, Yannick Bonhomme, Samuel Evain, 2012, 2012 17th IEEE European Test Symposium (ETS).

A Gated Clock Scheme for Low Power Testing of Logic Cores

Arnaud Virazel, Patrick Girard, Serge Pravossoudovitch, 2006, J. Electron. Test..

Error prediction based on concurrent self-test and reduced slack time

Valentin Gherman, Stéphane Chevobbe, Yannick Bonhomme, 2011, 2011 Design, Automation & Test in Europe.

Programmable extended SEC-DED codes for memory errors

Valentin Gherman, Fabrice Auzanneau, Yannick Bonhomme, 2011, 29th VLSI Test Symposium.

An efficient scan tree design for test time reduction

Patrick Girard, Hideo Fujiwara, Tomokazu Yoneda, 2004, Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004..

Process for improving the detection accuracy and fault location by reflectometry in an electric cable network

Fabrice Auzanneau, Yannick Bonhomme, Julien Guilhemsang, 2008 .

Efficient scan chain design for power minimization during scan testing under routing constraint

Patrick Girard, Serge Pravossoudovitch, Christian Landrault, 2003, International Test Conference, 2003. Proceedings. ITC 2003..

Online Test Method of floors not used temporarily pipeline and its associated device

Valentin Gherman, Yannick Bonhomme, 2010 .

Scan design with shadow flip-flops for low performance overhead and concurrent delay fault detection

Lirida A. B. Naviner, Valentin Gherman, Yannick Bonhomme, 2013, 2013 Design, Automation & Test in Europe Conference & Exhibition (DATE).

Generalized parity-check matrices for SEC-DED codes with fixed parity

Valentin Gherman, Yannick Bonhomme, Samuel Evain, 2011, 2011 IEEE 17th International On-Line Testing Symposium.

OMTDR based integrated cable health monitoring system SmartCo: An embedded reflectometry system to ensure harness auto-test

Antoine Dupret, Luca Incarbone, Fabrice Auzanneau, 2015, 2015 IEEE 10th Conference on Industrial Electronics and Applications (ICIEA).

WIRELESS SENSOR AND ACTOR NETWORKS II

Wael Abd-Almageed, Mohamed Eltoweissy, Hervé Guyennet, 2008 .