Charles C. Hong

Chemical Biology: Methods and Protocols

Charles H. Williams, Jonathan E. Hempel, Charles C. Hong, 2015 .

Breakdown Energy of Metal (BEM) - A New Technique for Monitoring Metallization Reliability at Wafer Level

Dwight L. Crook, Charles C. Hong, D. Crook, 1985, 23rd International Reliability Physics Symposium.

Optimal acceleration of cyclic THB tests for plastic-packaged devices

Charles C. Hong, C. G. Shirley, C. Shirley, 1991, 29th Annual Proceedings Reliability Physics 1991.