Frederick W. Duewer

X-ray microscopy for NDE of micro- and nano-structrues (Invited Paper)

David Scott, Michael Feser, Wenbing Yun, 2005, SPIE Smart Structures and Materials + Nondestructive Evaluation and Health Monitoring.

Pathways to sub-10nm x-ray imaging using zone plate lens

Michael Feser, Alan Lyon, Wenbing Yun, 2004, SPIE Optics + Photonics.