Rock-Hyun Baek

Experimental Verification of a Simple, Intuitive, and Accurate Closed-Form Transfer Function Model for Diverse High-Speed Interconnects

Byungsub Kim, Tony Tae-Hyoung Kim, Myat Thu Linn Aung, 2018, 2018 International SoC Design Conference (ISOCC).

Effects of layout and process parameters on device/circuit performance and variability for 10nm node FinFET technology

Chang Yong Kang, Raj Jammy, Rock-Hyun Baek, 2013, 2013 Symposium on VLSI Technology.

Device Design Guidelines for Nanoscale FinFETs in RF/Analog Applications

Yoon-Ha Jeong, Chang Yong Kang, Rock-Hyun Baek, 2012, IEEE Electron Device Letters.

Effect of fin height of tapered FinFETs on the sub-22-nm System on Chip (SoC) application using TCAD simulation

Sung-Ho Kim, Yoon-Ha Jeong, Chang Yong Kang, 2013, 2013 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA).

Investigation of process-induced performance variability and optimization of the 10 nm technology node Si bulk FinFETs

Chang Yong Kang, Rock-Hyun Baek, Dae Mann Kim, 2014 .

Scalability of OTS Integrated PCM for 3-D Stackable Cross-point Array Structure Using TCAD Simulation

Rock-Hyun Baek, Hyundong Jang, Hyeon Gwan Oh, 2019 .