S. Criel
发表
Daniël De Zutter,
Jan De Moerloose,
R. De Smedt,
1998
.
D. De Zutter,
S. Criel,
L. Martens,
1994,
Proceedings of IEEE Symposium on Electromagnetic Compatibility.
Daniël De Zutter,
Tom Dhaene,
S. Criel,
1992
.
D. De Zutter,
S. Criel,
L. Martens,
1995,
Proceedings of International Symposium on Electromagnetic Compatibility.
D. De Zutter,
S. Criel,
L. Martens,
1994,
Proceedings of 1994 IEEE Electrical Performance of Electronic Packaging.
Femke Olyslager,
Daniël De Zutter,
Eric Laermans,
1998
.
S. Criel,
L. Martens,
R. De Smedt,
1996,
Quality Measurement: The Indispensable Bridge between Theory and Reality (No Measurements? No Science! Joint Conference - 1996: IEEE Instrumentation and Measurement Technology Conference and IMEKO Tec.
S. Criel,
1999
.
D. De Zutter,
S. Criel,
L. Martens,
1995,
Proceedings of International Symposium on Electromagnetic Compatibility.
S. Criel,
P. De Langhe,
D. Ceuterick,
1995
.
S. Criel,
P. De Langhe,
D. Ceuterick,
1998
.
Femke Olyslager,
Daniël De Zutter,
Eric Laermans,
1999
.
Daniël De Zutter,
S. Criel,
1993
.
Daniël De Zutter,
Luc Martens,
S. Criel,
1994
.
S. Criel,
B. Demoulin,
R. De Smedt,
2000,
IEEE International Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.00CH37016).
D. De Zutter,
S. Criel,
L. Martens,
1993,
Proceedings of IEEE Electrical Performance of Electronic Packaging.
Daniël De Zutter,
Eric Laermans,
Femke Olyslager,
1997
.
S. Criel,
R. De Smedt,
D. De Zutter,
1997,
IEEE 1997, EMC, Austin Style. IEEE 1997 International Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.97CH36113).