Y. Shimamoto
发表
J. Yugami,
K. Torii,
O. Tonomura,
2004,
IEEE Transactions on Electron Devices.
J. Yugami,
R. Tsuchiya,
T. Mine,
2002,
2002 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.01CH37303).
D. Hisamoto,
K. Toba,
Y. Shimamoto,
2007,
2007 22nd IEEE Non-Volatile Semiconductor Memory Workshop.
S. De Gendt,
L. Pantisano,
M. Heyns,
2003,
IEEE International Electron Devices Meeting 2003.
Y. Mori,
D. Hisamoto,
Y. Shimamoto,
2015,
2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits.
Digh Hisamoto,
Kazuyoshi Torii,
Toshiyuki Mine,
2008,
2008 IEEE International Reliability Physics Symposium.
S. De Gendt,
D. Pique,
S. Van Elshocht,
2003,
2003 International Symposium on VLSI Technology, Systems and Applications. Proceedings of Technical Papers. (IEEE Cat. No.03TH8672).
T. Mine,
D. Hisamoto,
Y. Shimamoto,
2008,
IEEE Electron Device Letters.
J. Yugami,
R. Tsuchiya,
M. Horiuchi,
2002,
2002 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.01CH37303).
T. Mine,
D. Hisamoto,
Y. Shimamoto,
2013,
IEEE Transactions on Electron Devices.