Owen Farnsworth

On-chip repair and an ATE independent fusing methodology

Steven F. Oakland, Bruce Cowan, Owen Farnsworth, 2002, Proceedings. International Test Conference.

A SmartBIST variant with guaranteed encoding

Brion L. Keller, Thomas J. Snethen, Owen Farnsworth, 2001, Proceedings 10th Asian Test Symposium.

Extending OPMISR beyond 10x Scan Test Efficiency

Brion L. Keller, David Scott, Andrew Ferko, 2002, IEEE Des. Test Comput..

OPMISR: the foundation for compressed ATPG vectors

Brion L. Keller, Owen Farnsworth, Andrej Ferko, 2001, Proceedings International Test Conference 2001 (Cat. No.01CH37260).

An on-chip self-repair calculation and fusing methodology

Steven F. Oakland, Bruce Cowan, Owen Farnsworth, 2003, IEEE Design & Test of Computers.