Beyin Chen

Design verification by using universal test sets

Beyin Chen, Chong Len Lee, J. E. Chen, 1994, Proceedings of IEEE 3rd Asian Test Symposium (ATS).

Development and Evaluation of a Web 2.0-Based Ubiquitous Learning Platform for Schoolyard Plant Identification

Hui-Chun Chu, Gwo-Haur Hwang, Beyin Chen, 2014, Int. J. Distance Educ. Technol..

Development and Effectiveness Analysis of a Personalized Ubiquitous Multi-Device Certification Tutoring System Based on Bloom's Taxonomy of Educational Objectives

Cin-Wei Huang, Gwo-Haur Hwang, Beyin Chen, 2016, J. Educ. Technol. Soc..

Impacts of flipped classrooms with peer assessment on students’ effectiveness of playing musical instruments – taking amateur erhu learners as an example

Gwo-Haur Hwang, Beyin Chen, Chia-Wen Sung, 2018, Interact. Learn. Environ..

Impacts of a dynamic grouping strategy on students' learning effectiveness and experience value in an item bank-based collaborative practice system

Beyin Chen, Gwo‐Haur Hwang, Tze‐Shiun Lin, 2020, Br. J. Educ. Technol..

Development and Analysis of an Enhanced Multi-Expert Knowledge Integration System for Designing Context-Aware Ubiquitous Learning Contents

Gwo-Haur Hwang, Beyin Chen, Shiau-Huei Huang, 2018, Int. J. Distance Educ. Technol..

A complement-based fast algorithm to generate universal test sets for multi-output functions

Chung-Len Lee, Beyin Chen, 1994, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

Development of a Web 2.0-based Ubiquitous Learning Platform for Schoolyard Plant Identification

Hui-Chun Chu, Gwo-Haur Hwang, Beyin Chen, 2012, 2012 IEEE Seventh International Conference on Wireless, Mobile and Ubiquitous Technology in Education.

Differences between students’ learning behaviors and performances of adopting a competitive game-based item bank practice approach for learning procedural and declarative knowledge

Gwo-Haur Hwang, Beyin Chen, Yu-Ling Lai, 2019, Interact. Learn. Environ..

Universal test set generation for CMOS circuits

Beyin Chen, Chia Lin Lee, Chung-Len Lee, 1993, Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS).

Fanout fault analysis for digital logic circuits

Wen-Zen Shen, Chung-Len Lee, Jwu E. Chen, 1995, Proceedings of the Fourth Asian Test Symposium.