Evan Zhao

Scalog: Seamless Reconfiguration and Total Order in a Scalable Shared Log

Robbert van Renesse, Xiang Li, Lorenzo Alvisi, 2020, NSDI.

Using pattern analysis methods to do fast detection of manufacturing pattern failures

Jeff Wang, Yifan Zhang, Hua Ding, 2016, SPIE Advanced Lithography.

Augmenting Perceived Softness of Haptic Proxy Objects Through Transient Vibration and Visuo-Haptic Illusion in Virtual Reality

Sean Follmer, Eric J. Gonzalez, Eric J Gonzalez, 2020, IEEE Transactions on Visualization and Computer Graphics.